Auger electron
英 [ˈɔːɡə(r) ɪˈlektrɒn]
美 [ˈɔːɡər ɪˈlektrɑːn]
网络 欧杰电子; 俄歇电子; 俄歇; 鄂惹电子; 奥格电子
双语例句
- Tables of Peak Positions for XPS Photoelectron and Auger Electron Peaks
XPS光电子峰和俄歇电子峰峰位表 - Study on the Interface Between Metal Uranium and Aluminum Film by Auger Electron Spectroscopy
金属铀与铝薄膜界面的俄歇电子能谱研究 - The accuracy of ordinary method of quantitative analysis by Auger electron spectros-copy is about 30%.
俄歇电子谱定量分析的通常方法的准确度为±30%。 - The simulation of the Auger electron emissions in scanning probe electron energy spectrometer ( SPEES) is reported.
报道了对扫描探针电子能谱仪（SPEES）中俄歇电子出射的理论模拟研究。 - Angular Distribution Auger Microscopy ── a New Development in Auger Electron Spectroscopy
角分布俄歇显微术&俄歇电子能谱的新进展 - Scanning Auger electron spectroscopy
扫描俄歇电子能谱学 - Study on Fluorine Induced Aluminum Bonding Pads Corrosions Using Auger Electron Spectroscopy
利用俄歇电子能谱仪研究Al焊垫表面的F腐蚀 - Evaluation of the Auger Electron Radiation on Gene with Raman Spectroscopy
激光拉曼光谱分析俄歇电子对基因结构的影响 - Applications of Auger electron spectrometer in material analysis
俄歇电子能谱仪在材料分析中的应用 - The initial oxidation of pure iron and implanted samples which were overlapped energy ion – implanted with C ions was studied by auger electron spectroscopy ( AES).
用俄歇电子能谱（AES）研究高真空室中纯铁和多能量叠加注碳纯铁表面与氧气吸附及初始氧化过程。 - Auger electron spectroscopy ( AES), scanning electron microscopy ( SEM) and atomic force microscopy ( AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱（AES）、扫描电镜（SEM）和原子力显微镜（AFM）对薄膜的组成成分和表面形貌进行了分析。 - The thickness of the oxide film was measured by Auger electron spectroscopy ( AES).
用Auger电子能谱（AES）分析氧化膜厚度。 - The phase composition, depth profile of N, and the wear mechanisms of the modified layers were investigated by means of X ray diffraction ( XRD), Auger electron spectroscopy ( AES), and scanning electron microscopy ( SEM).
用扫描电子显微镜（SEM）、俄歇电子能谱仪（AES）和X射线衍射仪（XRD）考察了改性层的相组成、N元素的深度分布及磨损机理。 - Electron energy loss spectroscopy ( EELS) of uranium and its oxidation processes were studied by Auger electron spectroscopy.
利用俄歇电子能谱仪获取了表面清洁的铀及其在氧化过程中的电子能量损失谱（EELS），研究这些电子能量损失谱线显示：清洁表面铀的等离子损失的实验值与理论值较为符合； - The wear resistance and adhesion were measured through nano Indentation and Scratch tester. Microstructures of thin films were characterized by X-ray photoemission spectroscopy ( XPS), X-ray diffraction ( XRD) and auger electron spectroscopy ( AES).
通过X射线光电子能谱（XPS）、X射线衍射（XRD）和俄歇电子能谱（AES）分析研究了薄膜的结构特征；测试了薄膜与基底的附着力和耐磨性； - Introduce the measuring principle of auger electron spectroscopy apparatus. applying the apparatus to failure analysis is illustrated.
介绍俄歇电子能谱仪的测试原理，举例说明在失效分析中的应用。 - The problems associated with the Auger electron analysis of SnO_x ultrafine particle films are discussed.
本文讨论了用AES分析SnOx超微粒子薄膜表面的有关问题。 - The surface sputtering of the binary Cu-Ti amorphous alloy systems has been studied using low energy ion scattering spectroscopy ( ISS) and Auger electron spectroscopy ( AES) in this paper.
本文用低能离子散射谱（ISS）和Auger电子谱（AES）研究了二元非晶态Cu-Ti合金系的表面溅射。 - A Field-emission Microprobe Forming System for the Scanning Auger Electron Microscope
一个用于俄歇微分析的场发射枪探针系统 - A system of Auger electron spectroscopy ( AES) for surface analysis was presented.
介绍了一台用于表面分析的俄歇电子能谱仪（AES）系统。 - Studies of surface and interface for thin cu_xs-cds heterostructure by Auger electron spectroscopy
薄膜CuXS-CdS异质结构中的表面和界面的AES谱研究 - The component and characteristics of film have been studied by means of Infrared Spectroscopy, Auger Electron Spectroscopy, Ellipsometry and C-V measurement.
利用红外吸收光谱、俄歇电子能谱、椭圆偏振仪及C&V测试等分析方法研究了氮化硅膜的成份和性能。 - Characteristics of TiN_x Film and Analysis by Auger Electron Spectroscopy
TINx薄膜的特性和俄歇电子能谱分析 - The Rutherford backseat tering technique, Auger electron spectra and X-ray electron spectra have been used to study the structure of the implanted layer, the implanted ion range and the ion profile.
应用卢瑟福背散射分析（RBS）、俄歇电子能谱分析（AES）和X-光电子能谱分析（XPS）等测试手段，研究了注入层结构、注入射程和纵向浓度分布。 - The composition and depth distribution of elements on the surfaces of Co ion implantation modified carbon fiber microelectrode were determined by scanning electron microscope and Auger electron spectroscopy.
用扫描电子显微镜（SEM）和俄歇电子能谱（AES）两种表面分析技术对Co离子注入修饰微电极的表面状况、表面元素组成及深度分布进行测定。 - Microstructures of thin films are characterized by X-ray Diffraction ( XRD) and auger Electron spectroscopy ( AES).
通过X射线衍射（XRD）和俄歇电子能谱（AES）分析研究了薄膜的微结构； - The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.
结合俄歇电子能谱和红外光谱分析膜的微观结构，对薄膜的电子注入特性进行了理论分析与讨论。 - In-situ film composition analysis was carried out in the analysis chamber with Auger electron spectroscopy ( AES).
利用在位俄歇电子能谱（AES）分析了薄膜表面的组分。 - It indicates that alpha or auger electron emitters are suitable for radioimmunotherapy of dispersive and small tumor cell.
这提示α核素和俄歇电子核素较为适合用于弥散型小细胞肿瘤的放射免疫治疗。 - However, the relative short range of alpha particle and auger electron limits the energy deposited in surrounding cell.
但α粒子和俄歇电子较短的射程限制了α核素和俄歇电子核素对周围细胞的交互作用。